Compact White Light Measurement System
The WLS qFLASH projects a random pattern on the measuring object and analyses surfaces, features and edge lines using stereo vision. Paired with Hexagon Metrology proprietary CoreView 3D measurement suite, the WLS qFLASH is the perfect tool for a broad range of applications:
Leading-edge technology for shop floor conditions: The Hexagon Metrology WLS qFLASH is immune to industrial light, machinery vibrations and temperature changes. It can be operated on a pedestal or in handheld mode. The WLS qFLASH is a smart and powerful top performer, even for restrained budgets.
qFLASH Technical Specifications
|Cameras||3 x 4.2 Megapixel digital cameras designed for industrial applications.
Protected by rigid and temperature stable carbon fibre housing.
|Projection & 3D Reconstruction Technology||Random Pattern Projection and Rapid Shot Stereo Vision Technology.
Integrated 2D & 3D technology for fast and accurate surface and feature measurement.
|Illumination||Blue LED based high power illumination. Reliable and durable.|
|FOV Specifications||Field of view (at a specified working distance): 350 X 350 mm
Depth of Field: 160 mm
Optimal Working Distance: 550 mm
Point Cloud Spacing: From 0.19 mm
|VDI / VDE 2634 Part 2||System MPE according to VDI / VDE 2634 Part 2 (350 X 350 mm FOV lens, RE mode); Industry Applications
Probing Error: 0.040 mm
Spacing Error: 0.035 mm
Flatness Error: 0.035 mm
|Industrial Performance||Numbers stated in 2 sigma, LFOV, avg to avg. (WLS qFLASH-CMM),
external mapping is used
Plane measurement accuracy (Single tile): 0.035 mm
WLS qFLASH Point cloud accuracy (3 x 2 x 1 m size object): 0.1 mm
|Operation Performance||Average Optical Exposure Time (Typical settings): 20 msec|
|Dimensions & Weights||WLS qFLASH Sensor
370 X 270 X 255 mm, 6.0 kg
WLS qFLASH Power Supply
310 X 215 X 60mm, 3 kg
|Electrical compatibility||Voltage: 90-230 VAC 50-60 Hz
Power: 0.7 kW - at peak consumption
|Working environment conditions||Operating temperature: 5 - 35°C (Limited by PC/Laptop specification. Can be
enhanced with cooling systems.)
Operating lighting conditions: Low sensitivity to industrial lighting, ambient light sources and non direct daylight.
Structure/facility vibrations: Designed for operation in industrial environments.
|Periodic system certification||On site yearly calibration and certification to traceable artefacts|
|Computer & Software||Operating System: Windows 7 64Bit OS
Computing platform: Laptop
System Software: CoreView™ by Hexagon Metrology
|Certifications & standards||CE / TÜV -Safety: IEC\EN 61010-1:2001 EMC: IEC\EN 61000 VDI/VDE 2634 Part 2 standard for optical measurement systems.
Traceability to NIST metrology standard artefacts ISO 9001:2000